Published 1990 | Version v1
Journal article Metadata-only

Low frequency noise of silicon radiation detectors

Creators

  • 1. Vysoka Skola Technicka, Kosice (Czechoslovakia)

Description

Experimental results are summarized of measuring the low frequency noise of surface barrier silicon detectors of the Au-Si(N) type at a temperature of 300 K. (author). 4 figs., 7 refs

Additional details

Additional titles

Original title (Slovak)
Nizkofrekvencny sum kremikovych detektorov ziarenia

Publishing Information

Journal Title
Elektrotechnicky Casopis
Journal Volume
41
Journal Issue
8
Series
Elektrotech. Cas.
Journal Page Range
631-636
ISSN
0013-578X
CODEN
ELKCA

INIS

Country of Publication
Slovakia
Country of Input or Organization
Serbia and Montenegro
INIS RN
22052273
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
FREQUENCY DEPENDENCE; KHZ RANGE 01-100; MEDIUM TEMPERATURE; NOISE; RESOLUTION; SI SEMICONDUCTOR DETECTORS; SIGNAL-TO-NOISE RATIO; SURFACE BARRIER DETECTORS
Descriptors DEC
FREQUENCY RANGE; KHZ RANGE; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS

Optional Information

Notes
English translation available from Nuclear Information Center, 156 16 Prague 5-Zbraslav, Czechoslovakia, at US$ 10 per typewritten page.