Published June 2, 2014
| Version v1
Journal article
Optical properties of strain-free AlN nanowires grown by molecular beam epitaxy on Si substrates
Creators
- 1. Department of Electrical and Computer Engineering, McGill University, 3480 University Street, Montreal, Quebec H3A 0E9 (Canada)
- 2. Department of Chemistry, McGill University, 801 Sherbrooke St West, Montreal, Quebec H3A 0B8 (Canada)
- 3. Department of Electrical and Computer Engineering, Texas Tech University, Lubbock, Texas 79409 (United States)
Description
The optical properties of catalyst-free AlN nanowires grown on Si substrates by molecular beam epitaxy were investigated. Such nanowires are nearly free of strain, with strong free exciton emission measured at room temperature. The photoluminescence intensity is significantly enhanced, compared to previously reported AlN epilayer. Moreover, the presence of phonon replicas with an energy separation of ∼100 meV was identified to be associated with the surface-optical phonon rather than the commonly reported longitudinal-optical phonon, which is further supported by the micro-Raman scattering experiments.
Additional details
Identifiers
- DOI
- 10.1063/1.4881558;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 104
- Journal Issue
- 22
- Journal Page Range
- p. 223107-223107.4
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46006263
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ALUMINIUM NITRIDES; CATALYSTS; MOLECULAR BEAM EPITAXY; NANOWIRES; OPTICAL PROPERTIES; PHONONS; PHOTOLUMINESCENCE; QUANTUM WIRES; RAMAN EFFECT; SCATTERING; STRAINS; SUBSTRATES; SURFACES; TEMPERATURE RANGE 0273-0400 K
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CRYSTAL GROWTH METHODS; EMISSION; EPITAXY; LUMINESCENCE; NANOSTRUCTURES; NITRIDES; NITROGEN COMPOUNDS; PHOTON EMISSION; PHYSICAL PROPERTIES; PNICTIDES; QUASI PARTICLES; TEMPERATURE RANGE
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC