Published June 15, 2015 | Version v1
Journal article

The study of structure and optical properties of Nanoparticles(NPs)-Cu/SiO2 multilayer films deposited alternately by magnetron sputtering technique

Description

NPs-Cu/SiO2 multilayer films were deposited alternately by magnetron sputtering on single silicon and Corning glass substrate with different Cu target power at room temperature (RT) and 400 °C. The structure of the NPs-Cu/SiO2 films was analyzed by X-ray diffraction (XRD) and transmission electron microscopy (TEM). The optical absorption property was investigated by Ultraviolet–visible spectroscopy (UV–Vis). The results of XRD and TEM indicate that Cu nanoparticles are basically spherical and disperse in the SiO2 matrix. The optical absorption peaks due to the surface plasmon resonance (SPR) of Cu nanoparticles are observed in the wavelength range of 590–650 nm. The SPR peak for NPs-Cu/SiO2 multilayer films shows the red-shift trend with increasing Cu target power, however, the SPR peak shows the blue-shift trend with increasing the substrate temperature and the number of Cu layers

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jallcom.2015.01.166

Additional details

Identifiers

DOI
10.1016/j.jallcom.2015.01.166;
PII
S0925-8388(15)00264-9;

Publishing Information

Journal Title
Journal of Alloys and Compounds
Journal Volume
634
Journal Page Range
p. 281-287
ISSN
0925-8388
CODEN
JALCEU

Optional Information

Copyright
Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.