Ion, electron and laser beams for Cultural Heritage investigations by Czech-Italian collaboration
- 1. Dipartimento di Scienze Matematiche e Informatiche, Scienze Fisiche e Scienze della Terra (MIFT), Università di Messina, V.le F.S. d'Alcontres 31, 98166 S. Agata, Messina (Italy)
- 2. Nuclear Physics Institute, AS CR, 25068 Rez (Czech Republic)
Description
An overview of physical investigations of cultural heritage samples using ion and laser beams performed in the frame of the international collaboration between the University of Messina (Italy) and the Nuclear Physics Institute-ASCR (Czech Republic) is presented. Solid samples are analysed in high vacuum using particle induced X-ray emission, Rutherford backscattering spectrometry, elastic recoil detection analysis, prompt activation analysis, nuclear reaction analysis, laser ablation, mass spectrometry, scanning electron microscopy, and many more. The elemental composition of the sample, the trace elements, the depth profiles, the morphology and the comparison between samples and references are reported. Both electron and ion microbeams are employed to have details of the spatial distribution maps of elements of interest.
Availability note (English)
Available from http://dx.doi.org/10.1088/1748-0221/15/04/C04050Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Instrumentation
- Journal Volume
- 15
- Journal Issue
- 04
- Journal Page Range
- p. C04050
- ISSN
- 1748-0221
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52078950
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ABLATION; ACTIVATION ANALYSIS; DETECTION; IONS; LASERS; MASS SPECTROSCOPY; NUCLEAR PHYSICS; NUCLEAR REACTION ANALYSIS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SPATIAL DISTRIBUTION; TRACE AMOUNTS; X RADIATION
- Descriptors DEC
- CHARGED PARTICLES; CHEMICAL ANALYSIS; DISTRIBUTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; IONIZING RADIATIONS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; PHYSICS; RADIATIONS; SPECTROSCOPY