Published January 14, 2011
| Version v1
Journal article
Determination of the second-order nonlinear susceptibility elements of a single nanoparticle using coherent optical microscopy
- 1. Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, 1406 W. Green St., Urbana, IL 61801 (United States)
- 2. Creare Inc, PO Box 71, 16 Great Hollow Road, Hanover, NH 03755 (United States)
- 3. The Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 405 North Mathews Ave., Urbana, IL 61801 (United States)
Description
We present a technique based on the use of coherent confocal microscopy that can be used to estimate, to within a scale factor, all of the elements of the second-order susceptibility tensor of a single pointlike nanoparticle under permutation and Kleinman symmetry. An estimate of the three-dimensional position of a nanoparticle is also obtained. A forward model for the problem is presented and a method for solving the inverse problem is demonstrated. The approach is tested through simulations which show that the position and the elements of the susceptibility tensor can be robustly retrieved using this method.
Availability note (English)
Available from http://dx.doi.org/10.1088/0953-4075/44/1/015401Additional details
Identifiers
- DOI
- 10.1088/0953-4075/44/1/015401;
- PII
- S0953-4075(11)69070-0;
Publishing Information
- Journal Title
- Journal of Physics. B, Atomic, Molecular and Optical Physics
- Journal Volume
- 44
- Journal Issue
- 1
- Journal Page Range
- [6 p.]
- ISSN
- 0953-4075
- CODEN
- JPAPEH
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43013311
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- COHERENT RADIATION; NANOSTRUCTURES; NONLINEAR PROBLEMS; OPTICAL MICROSCOPY; SIMULATION; SYMMETRY; THREE-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; MICROSCOPY; RADIATIONS