The use of time averaged emitting probes to study plasma processing
- 1. Univ. of Wisconsin-Madison, Madison, WI 53706
Description
Sheaths in capacitive RF discharges play an important role in a variety of plasma processing techniques. Recently it has been demonstrated that time averaged emitting probe characteristics can be used to determine the maximum and minimum potential value of the time varying RF potential with good spatial resolution. This allows one to determine many of the details of time varying sheath potentials. A first step in the application of this technique to plasma processing by ions energized in sheath is presented. Sheaths in a dc multi-dipole plasma with RF coupled either with a capacitor or directly to conductors on which insulators are mounted are presented. Experimental data cover a range of frequencies and neutral pressures. An important issue considered is the value of the RF self bias of the insulator and of the plasma. In addition, evidence is presented for the presence of non-monotonic potentials
Additional details
Publishing Information
- Publisher
- IEEE Service Center.
- Imprint Place
- Piscataway, NJ (USA)
- Imprint Title
- Conference record of the 1986 IEEE international conference on plasma science
- Journal Page Range
- p. 26.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 18025190
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ELECTRIC DISCHARGES; ELECTRIC POTENTIAL; ELECTRIC PROBES; ELECTROCHEMISTRY; FREQUENCY DEPENDENCE; HEATING; MICROWAVE RADIATION; PERFORMANCE; PLASMA DIAGNOSTICS; PLASMA PRODUCTION; PRESSURE DEPENDENCE; PROBES; RESOLUTION; RF SYSTEMS; TIME DEPENDENCE
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; RADIATIONS