Published May 2016 | Version v1
Journal article

A numerical model for multiple detector energy dispersive X-ray spectroscopy in the transmission electron microscope

Description

Here we report a numerical approach to model a four quadrant energy dispersive X-ray spectrometer in the transmission electron microscope. The model includes detector geometries, specimen position and absorption, shadowing by the holder, and filtering by the Be carrier. We show that this comprehensive model accurately predicts absolute counts and intensity ratios as a function of specimen tilt and position. We directly compare the model to experimental results acquired with a FEI Super-X EDS four quadrant detector. The contribution from each detector to the sum is investigated. The program and source code can be downloaded from (https://github.com/subangstrom/superAngle). - Highlights: • A novel numeric model is developed to predict the effective detector collection angle for multi-detector EDS in the transmission electron microscope. • The precise geometry of specimen holder is incorporated to determine the influence of holder shadowing • The role of X-ray filtering by the Be specimen carrier is investigated. • Predicted counts and intensity ratios are directly compared to experiment as a function of tilt and are shown to be in excellent agreement • The detector intensity sum effectively reduces errors compared to the individual detector signals.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2016.02.004

Additional details

Identifiers

DOI
10.1016/j.ultramic.2016.02.004;
PII
S0304-3991(16)30011-0;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
164
Journal Page Range
p. 51-61
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
48021842
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CORRECTIONS; ERRORS; FILTERS; SAMPLE HOLDERS; SIGNALS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY SPECTROMETERS; X-RAY SPECTROSCOPY
Descriptors DEC
ELECTRON MICROSCOPY; MEASURING INSTRUMENTS; MICROSCOPY; SPECTROMETERS; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.