Published 2015
| Version v1
Conference paper
Open
Photoluminescence analysis influenced by passivation of oxidized structures of porous silicon
Creators
- 1. Instituto Nacional de Pesquisas Espaciais (INPE), Sao Jose dos Campos, SP (Brazil)
Description
no abstract available
Files
49071943.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 1 p.
- Report number
- INIS-BR--20815
Conference
- Title
- 14. Brazil MRS meeting
- Dates
- 27 Sep - 1 Oct 2015
- Place
- Rio de Janeiro, RJ (Brazil)
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 49071943
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- No Abstract, Conference
- Descriptors DEI
- ETCHING; FOURIER TRANSFORMATION; INFRARED SPECTRA; OXIDATION; PASSIVATION; PHOTOLUMINESCENCE; POROUS MATERIALS; SCANNING ELECTRON MICROSCOPY; SILICON; X-RAY DIFFRACTION
- Descriptors DEC
- CHEMICAL REACTIONS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; EMISSION; INTEGRAL TRANSFORMATIONS; LUMINESCENCE; MATERIALS; MICROSCOPY; PHOTON EMISSION; SCATTERING; SEMIMETALS; SPECTRA; SURFACE FINISHING; TRANSFORMATIONS