Published March 1, 1989 | Version v1
Journal article

Trace element determinations with synchrotron-induced x-ray emission

  • 1. Brookhaven National Lab., Upton, NY (USA)

Description

Synchrotron radiation-source-produced X-rays make it possible to determine trace element concentrations below 1 ppm in sample volumes of 10-9 cm3 by an extension of conventional X-ray fluorescence techniques. Keith W. Jones and Barry M. Gordon of Brookhaven National Laboratory outline the concepts of the technique and discuss its application to problems in terrestrial geochemistry, biology, and biomedicine

Additional details

Publishing Information

Journal Title
Analytical Chemistry (Washington)
Journal Volume
61
Journal Issue
5
Series
Anal. Chem. (Wash.).
Journal Page Range
341A-358A
ISSN
0003-2700
CODEN
ANCHA