Published 1987
| Version v1
Miscellaneous
Comparative analysis of some measuring techniques of the thickness of niobium and tantalum oxide anodic films
Creators
- 1. Rio Grande do Norte Univ., Natal (Brazil). Dept. de Fisica
Description
Published in summary form only
Additional details
Additional titles
- Original title (Portuguese)
- Analise comparativa de algumas tecnicas de medida de espessura de filmes anodicos de oxidos de niobio e tantalo
Publishing Information
- Imprint Title
- Proceedings of the 5. Meeting of Physicists from Northeast - Abstracts
- Imprint Pagination
- 66 p.
- Journal Page Range
- p. 10.
- Report number
- INIS-BR--1018
Conference
- Title
- 5. Meeting of Physicists from Northeast.
- Dates
- 12-13 Nov 1987.
- Place
- Natal, RN (Brazil).
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 19054459
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- ANODIZATION; CAPACITANCE; COMPARATIVE EVALUATIONS; ELECTRIC POTENTIAL; FARADAY LAWS; FILMS; MEASURING METHODS; MICROBALANCES; NIOBIUM OXIDES; TANTALUM OXIDES; THICKNESS
- Descriptors DEC
- BALANCES; CHALCOGENIDES; CHEMICAL COATING; CORROSION PROTECTION; DEPOSITION; DIMENSIONS; ELECTRICAL PROPERTIES; ELECTROCHEMICAL COATING; ELECTROLYSIS; EVALUATION; MEASURING INSTRUMENTS; NIOBIUM COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SURFACE COATING; TANTALUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; WEIGHT INDICATORS
Optional Information
- Notes
- Imprint:Anais do 5. Encontro de Fisicos do Nordeste - Resumos.