Deuterium permeation behaviors in tungsten implanted with nitrogen
Creators
- 1. Center of Interface Dynamics for Sustainability, Institute of Materials, China Academy of Engineering Physics, Chengdu 610200 (China)
- 2. Science and Technology on Surface Physics and Chemistry Laboratory, P.O. Box 718-35, Mianyang 621907 (China)
Description
Surface modification of tungsten due to the cooling species nitrogen seeded in the divertor region, i.e., by nitrogen ion implantation or re-deposition, is considered to affect the permeation behavior of H isotopes. This work focuses on the effect of nitrogen ion implantation into tungsten (W-N) on the deuterium gas-driven permeation behavior. For comparison, both permeation in tungsten implanted with W ion (W-W) and without implantation (pristine W) are studied. These three samples were characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD), and X-ray photo-electron spectroscopy (XPS). The SEM results revealed that the W-W sample has various voids on the surface, and the W-N sample has a rough surface with pretty fine microstructures. These are different from the pristine W sample with a smooth and compact surface. The XRD patterns show the disappearance of crystallinity on both W-W and W-N sample surfaces. It indicates that the ion implantation process results in an almost complete conversion from crystalline to amorphous in the sample surfaces. The sputter-depth profiling XPS spectra show that the implanted nitrogen prefers to form a 140 nm thick tungsten nitride layer. In permeation experiments, it was found that the D permeability is temperature dependent. Interestingly, the W-N sample presented a lower D permeability than the W-W sample, but higher than the pristine W sample. Such behavior implies that tungsten nitride acts as a permeation barrier, while defects created by ions implantation can promote permeability. The possible permeation mechanism correlated with sample surface composition and microstructure is consequently discussed in this work.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jnucmat.2018.04.021Additional details
Identifiers
- DOI
- 10.1016/j.jnucmat.2018.04.021;
- PII
- S0022311517314563;
Publishing Information
- Journal Title
- Journal of Nuclear Materials
- Journal Volume
- 505
- Journal Page Range
- p. 174-182
- ISSN
- 0022-3115
- CODEN
- JNUMAM
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49100608
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ADSORPTION; DEUTERIUM; ION IMPLANTATION; NITROGEN IONS; PERMEABILITY; RADIOACTIVE WASTE DISPOSAL; SCANNING ELECTRON MICROSCOPY; TEMPERATURE DEPENDENCE; TUNGSTEN IONS; TUNGSTEN NITRIDES; WEATHERING; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; HYDROGEN ISOTOPES; IONS; ISOTOPES; LIGHT NUCLEI; MANAGEMENT; MICROSCOPY; NITRIDES; NITROGEN COMPOUNDS; NUCLEI; ODD-ODD NUCLEI; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; PNICTIDES; RADIOACTIVE WASTE MANAGEMENT; REFRACTORY METAL COMPOUNDS; SCATTERING; SORPTION; SPECTROSCOPY; STABLE ISOTOPES; TRANSITION ELEMENT COMPOUNDS; TUNGSTEN COMPOUNDS; WASTE DISPOSAL; WASTE MANAGEMENT
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.