Published April 1, 1991
| Version v1
Journal article
z-pinch plasma lens focusing of a heavy-ion beam
Creators
- 1. Max-Planck-Institut fuer Quantenoptik (MPQ), D-8046 Garching, Federal Republic of Germany (Germany, F.R.)
- 2. Gesellschaft fuer Schwerionenforschung (GSI), D-6100 Darmstadt, Federal Republic of (Germany)
- 3. Lehrstuhl fuer Lasertechnik, Rheinisch-Westfaelisch Technische Hochschule Aachen, D-5100 Aachen, Federal Republic of (Germany)
- 4. Institute for Theoretical and Experimental Physics, 117259 Moscow, (U.S.S.R.)
Description
For the first time a heavy-ion beam was focused using a z-pinch plasma lens. The diameter of an incident, parallel, 460-MeV argon-ion beam was reduced from ∼8 mm (FWHM) to ∼2 mm within 230 mm downstream of the plasma. Inside a cylindrically symmetric plasma column a high-gradient, azimuthal magnetic field is produced during a z-pinch discharge. For axially moving, high-energy charged particles this field configuration provides strong, first-order focusing simultaneously in both transversal planes. The measured spot size agrees with numerical calculations taking into account the finite beam emittance, and charge exchange as well as energy-loss processes contributing to aberrations
Additional details
Publishing Information
- Journal Title
- Physical Review Letters
- Journal Volume
- 66
- Journal Issue
- 13
- Series
- Phys. Rev. Lett.
- Journal Page Range
- 1705-1708
- ISSN
- 0031-9007
- CODEN
- PRLTA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 22077311
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ARGON IONS; BEAM EMITTANCE; BEAM OPTICS; CHARGE EXCHANGE; CORRELATIONS; CYLINDRICAL CONFIGURATION; ENERGY LOSSES; EXPERIMENTAL DATA; FOCUSING; HEAVY IONS; ION BEAMS; LENSES; LINEAR Z PINCH DEVICES; MAGNETIC FIELDS; MEV RANGE 100-1000; PLASMA; SIZE; STREAK PHOTOGRAPHY
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; CONFIGURATION; DATA; ENERGY RANGE; INFORMATION; IONS; LINEAR PINCH DEVICES; MEV RANGE; NUMERICAL DATA; OPEN PLASMA DEVICES; PHOTOGRAPHY; PINCH DEVICES; THERMONUCLEAR DEVICES