Exchange biasing in SFMO/SFWO double perovskite multilayer thin films
Creators
- 1. Functional Nanomaterials Research Laboratory, Department of Physics and centre of nanotechnology, IIT Roorkee, Roorkee 247667, Uttarakhand (India)
Description
Graphical abstract: Highlights: → SFMO is a ferromagnetic (FM) conductor with a high TC ∼ 420 K. → SFWO is an anti-ferromagnetic (AFM) insulator with a low TN ∼ 37 K. → Hysteresis loop for [SFMO/SFWO]15 after FC shifts horizontally opposite to the HFC. → HE decreases with increase in temperature and approaches to zero above TB. → HC decreases on either side of TB where it finds its maximum value. - Abstract: In the present study, we have studied the exchange bias interaction in ferromagnetic Sr2FeMoO6 (SFMO)/antiferromagnetic Sr2FeWO6 (SFWO) multilayer thin films deposited on single crystal LaAlO3 substrates using KrF pulsed laser deposition technique. XRD pattern revealed that SFMO, SFWO and their multilayer thin films were highly oriented along the c-axis. The microstructure studied by atomic force microscopy was found to be uniform, fine, dense and homogenous in nature. The observed magnetization-temperature curves showed Neel temperature TN ∼ 37 K for SFWO and Curie temperature TC > 320 K for SFMO thin films. For multilayer, the field cooled magnetization-field curve was shifted horizontally and the direction of the horizontal shift is opposite to that of HFC, indicating an exchange bias effect. Exchange bias field HE was found to decrease with increase in temperature and approached to zero at blocking temperature.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2011.05.006Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2011.05.006;
- PII
- S0925-8388(11)01041-3;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 509
- Journal Issue
- 30
- Journal Page Range
- p. 7886-7890
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43047712
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINATES; ANTIFERROMAGNETISM; ATOMIC FORCE MICROSCOPY; CURIE POINT; ENERGY BEAM DEPOSITION; HYSTERESIS; INTERACTIONS; LANTHANUM COMPOUNDS; LASER RADIATION; LAYERS; MAGNETIZATION; MICROSTRUCTURE; MONOCRYSTALS; NEEL TEMPERATURE; PEROVSKITE; PULSED IRRADIATION; SQUID DEVICES; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ALUMINIUM COMPOUNDS; COHERENT SCATTERING; CRYSTALS; DEPOSITION; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRONIC EQUIPMENT; EQUIPMENT; FILMS; FLUXMETERS; IRRADIATION; MAGNETISM; MEASURING INSTRUMENTS; MICROSCOPY; MICROWAVE EQUIPMENT; MINERALS; OXIDE MINERALS; OXYGEN COMPOUNDS; PEROVSKITES; PHYSICAL PROPERTIES; RADIATIONS; RARE EARTH COMPOUNDS; SCATTERING; SUPERCONDUCTING DEVICES; SURFACE COATING; THERMODYNAMIC PROPERTIES; TRANSITION TEMPERATURE
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.