Published July 28, 2011 | Version v1
Journal article

Exchange biasing in SFMO/SFWO double perovskite multilayer thin films

  • 1. Functional Nanomaterials Research Laboratory, Department of Physics and centre of nanotechnology, IIT Roorkee, Roorkee 247667, Uttarakhand (India)

Description

Graphical abstract: Highlights: → SFMO is a ferromagnetic (FM) conductor with a high TC ∼ 420 K. → SFWO is an anti-ferromagnetic (AFM) insulator with a low TN ∼ 37 K. → Hysteresis loop for [SFMO/SFWO]15 after FC shifts horizontally opposite to the HFC. → HE decreases with increase in temperature and approaches to zero above TB. → HC decreases on either side of TB where it finds its maximum value. - Abstract: In the present study, we have studied the exchange bias interaction in ferromagnetic Sr2FeMoO6 (SFMO)/antiferromagnetic Sr2FeWO6 (SFWO) multilayer thin films deposited on single crystal LaAlO3 substrates using KrF pulsed laser deposition technique. XRD pattern revealed that SFMO, SFWO and their multilayer thin films were highly oriented along the c-axis. The microstructure studied by atomic force microscopy was found to be uniform, fine, dense and homogenous in nature. The observed magnetization-temperature curves showed Neel temperature TN ∼ 37 K for SFWO and Curie temperature TC > 320 K for SFMO thin films. For multilayer, the field cooled magnetization-field curve was shifted horizontally and the direction of the horizontal shift is opposite to that of HFC, indicating an exchange bias effect. Exchange bias field HE was found to decrease with increase in temperature and approached to zero at blocking temperature.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jallcom.2011.05.006

Additional details

Identifiers

DOI
10.1016/j.jallcom.2011.05.006;
PII
S0925-8388(11)01041-3;

Publishing Information

Journal Title
Journal of Alloys and Compounds
Journal Volume
509
Journal Issue
30
Journal Page Range
p. 7886-7890
ISSN
0925-8388
CODEN
JALCEU

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.