Published February 28, 2007
| Version v1
Journal article
Light induced adsorption of Si nano-composites in LiF crystals at 157 nm
- 1. National Hellenic Research Foundation, Theoretical and Physical Chemistry Institute, 48 Vassileos Constantinou Avenue, Athens 11635 (Greece)
- 2. Jozef Stefan Institute, Department for Nanostructured Materials, Jamova 39, 1001 Ljubljana (Slovenia)
Description
Si nano-composites were precipitated on LiF crystals following ablation from Si targets with laser light at 157 nm. The LiF/Si interface was analyzed with scanning electron microscopy, atomic force microscopy and energy dispersive X-ray microanalysis. It was found that Si composites were strongly attached to LiF ionic sites to form inhomogeneous structures consisted of small isotropic crystals 0.1-1 μm long, rich in Si and fluorine, which eventually further agglomerate to form larger structures. The thickness of the LiF/Si interface was increased from 50 nm to 2 μm following laser irradiation at 157 nm, due to accelerated adsorption of Si in the LiF interface by VUV light
Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2006.09.062;
- PII
- S0169-4332(06)01277-3;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 253
- Journal Issue
- 9
- Journal Page Range
- p. 4438-4444
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39003388
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ABLATION; ADSORPTION; ATOMIC FORCE MICROSCOPY; COMPOSITE MATERIALS; CRYSTALS; FAR ULTRAVIOLET RADIATION; FLUORINE; INTERFACES; LASER RADIATION; LITHIUM FLUORIDES; MICROANALYSIS; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY; SILICON; THICKNESS; VISIBLE RADIATION; X RADIATION
- Descriptors DEC
- ALKALI METAL COMPOUNDS; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; FLUORIDES; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; HALOGENS; IONIZING RADIATIONS; LITHIUM COMPOUNDS; LITHIUM HALIDES; MATERIALS; MICROSCOPY; NONMETALS; RADIATIONS; SEMIMETALS; SORPTION; ULTRAVIOLET RADIATION
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.