Published September 15, 2016 | Version v1
Journal article

The relation of electrical conductivity profiles and modulus data using the example of STO:Fe single crystals: A path to improve the model of resistance degradation

  • 1. Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA 16802 (United States)
  • 2. Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27606 (United States)

Description

Resistance degradation in perovskites is characterized by an increase in current over time with applied electric field. This behavior can be simulated and spatially resolved conductivity profiles can be measured, but some inconsistencies remain. A new approach to address these problems is presented that utilizes time-resolved impedance spectroscopy with an applied DC voltage to provide new insight into the resistance degradation phenomenon. In particular, this method allows the in-situ acquisition of spatio-temporal variations in conductivity. In SrTiO3 a single bulk-dominated maximum of the imaginary part of the modulus M″ transitions to two maxima during degradation, reflecting the hole conductivity in the anode region and the electron conductivity in the cathode region. To clarify the influence of conductivity profiles on impedance data, the reversed route is presented by using simulated conductivity profiles to calculate impedance data. It will be emphasized that this methodology is not limited to the perovskite system considered here, but can be adapted to any kind of system characterized by a spatially varying conductivity.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.actamat.2016.07.024

Additional details

Identifiers

DOI
10.1016/j.actamat.2016.07.024;
PII
S1359-6454(16)30520-1;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
117
Journal Page Range
p. 252-261
ISSN
1359-6454
CODEN
ACMAFD

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.