Published 2009
| Version v1
Journal article
Structural properties of calcogenic thin films and alloys subjected to synchrotron light
- 1. Universidade Federal de Santa Catarina (UFSC), Florianopolis, SC (Brazil). Dept. de Fisica
- 2. Pontificia Univ. Catolica do Rio de Janeiro (PUC-Rio), RJ (Brazil). Dept. de Fisica
Description
Results on structural characterization of Sb50Te50 and Te24In38Sb38 alloys prepared as powder and after deposited as a thin films are presented. For that x ray diffraction and energy dispersive X-ray fluorescence were used. The nanocrystalline phases Sb2Te2 and Sb24Te9 were nucleated in both Sb50Te50 and Te24In38Sb38 alloys, respectively. The thin films of both binary and ternary alloys are mainly amorphous. According to X-ray fluorescence results the chemical composition inside the ultraviolet irradiated region on one of the binary thin film become different than that outside irradiation marks, suggesting Sb migration. (author)
Availability note (English)
Available from http://www.sbvacuo.org.br/rbav/index.php/rbav/article/view/481/811Additional details
Additional titles
- Original title (Portuguese)
- Propriedades estruturais de ligas e filmes finos calcogenicos submetidos a luz sincrotron
Identifiers
Publishing Information
- Journal Title
- Revista Brasileira de Aplicacoes de Vacuo
- Journal Volume
- 28
- Journal Issue
- 1-2
- Journal Page Range
- p. 1-6
- ISSN
- 0101-7659
- CODEN
- RBAVEP
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 44060783
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALLOYS; CHEMICAL COMPOSITION; FLUORESCENCE SPECTROSCOPY; MIGRATION; NANOSTRUCTURES; SYNCHROTRON RADIATION SOURCES; THIN FILMS; ULTRAVIOLET RADIATION; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; EMISSION SPECTROSCOPY; FILMS; IONIZING RADIATIONS; RADIATION SOURCES; RADIATIONS; SCATTERING; SPECTROSCOPY