Static states and dynamic behaviour of charges: observation and control by scanning probe microscopy
Creators
- 1. National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047 (Japan)
Description
This paper reviews charges that locally functionalize materials. Microscopic analyses and operation of charges using various scanning probe microscopy (SPM) techniques have revealed static, quasi-static/quasi-dynamic and dynamic charge behaviours. Charge-sensitive SPM has allowed for the visualization of the distribution of functionalized charges in electronic devices. When used as bit data in a memory system, the charges can be operated by SPM. The behaviour of quasi-static/quasi-dynamic charges is discussed here. In the data-writing process, spatially dispersive charges rather than a fast injection rate are introduced, but the technical problems can be solved by using nanostructures. Careful charge operations using SPM should realize a memory with a larger density than Tbit/inch2. Dynamic charges have been introduced in physical analyses and chemical processes. Although the observable timescale is limited by the SPM system response time of the order of several seconds, dynamics such as photon-induced charge redistributions and probe-assisted chemical reactions are observed. (topical review)
Availability note (English)
Available from http://dx.doi.org/10.1088/0953-8984/22/17/173001Additional details
Identifiers
- DOI
- 10.1088/0953-8984/22/17/173001;
- PII
- S0953-8984(10)04016-6;
Publishing Information
- Journal Title
- Journal of Physics. Condensed Matter
- Journal Volume
- 22
- Journal Issue
- 17
- Journal Page Range
- [12 p.]
- ISSN
- 0953-8984
- CODEN
- JCOMEL
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41106175
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CONTROL; DENSITY; DISTRIBUTION; ELECTRIC CHARGES; ELECTRONIC EQUIPMENT; INJECTION; NANOSTRUCTURES; OPERATION; PHOTONS; PROBES; REVIEWS; SCANNING ELECTRON MICROSCOPY
- Descriptors DEC
- BOSONS; DOCUMENT TYPES; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; EQUIPMENT; INTAKE; MASSLESS PARTICLES; MICROSCOPY; PHYSICAL PROPERTIES