Published March 2021 | Version v1
Journal article Metadata-only

Operand surface and interface measurement using sum frequency spectroscopy

Creators

  • 1. Chiba University, Graduate School of Engineering and Molecular Chirality Research Center, Chiba (Japan)

Description

no abstract available

Availability note (English)

Available from DOI: https://doi.org/10.11499/sicejl.60.202

Additional details

Additional titles

Original title (Japanese)
和周波分光を用いたオペランド界面計測

Identifiers

DOI
10.11499/sicejl.60.202;

Publishing Information

Journal Title
Keisoku To Seigyo (Online)
Journal Volume
60
Journal Issue
3
Series
雑誌名:計測と制御
Journal Page Range
p. 202-206
ISSN
1883-8170

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
52110073
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
No Abstract
Descriptors DEI
ADHESION; ARALDITE; ELECTRIC CHARGES; ELECTROLUMINESCENCE; FREQUENCY ANALYSIS; INTERFACES; ISOCYANATES; NONLINEAR OPTICS; SPECTRA; SPECTROSCOPY
Descriptors DEC
CARBONIC ACID DERIVATIVES; EMISSION; EPOXIDES; LUMINESCENCE; NITROGEN COMPOUNDS; OPTICS; ORGANIC COMPOUNDS; ORGANIC OXYGEN COMPOUNDS; ORGANIC POLYMERS; PHOTON EMISSION; POLYMERS

Optional Information

Notes
12 refs., 7 figs.