Published May 26, 2008 | Version v1
Journal article

Integration of thin layers of single-crystalline InP with flexible substrates

  • 1. Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, California 92093 (United States)
  • 2. Center for Energy Research, University of California, San Diego, La Jolla, California 92093 (United States)
  • 3. School of Materials, Arizona State University, Tempe, Arizona 85287 (United States)
  • 4. Department of Chemical and Biological Engineering, University of Wisconsin, Madison, Madison, Wisconsin 53706 (United States)

Description

Transfer of thin semiconductor layers onto flexible substrates using a combination of ion cutting, adhesive bonding, and laser ablation was investigated. An ∼1.3 μm thick InP layer was first transferred onto sapphire using adhesive bonding and hydrogen-induced layer exfoliation at ∼180 deg. C. The resulting structure was then adhesively bonded onto flexible polyethylene naphthalate substrate, followed by UV laser ablation of the first adhesive to separate the initial bond. Additional transfer steps were inserted into the process to enable thermal annealing and electrical recovery. The transferred films were electrically characterized and the potential use in high-speed, flexible electronics is discussed

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
92
Journal Issue
21
Journal Page Range
p. 212109-212109.3
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
(c) 2008 American Institute of Physics