All-Dielectric Metasurface Refractive Index Sensor with Microfluidics
Creators
- 1. State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou 310027 (China)
Description
Magnetic resonance and electrical resonance can be excited simultaneously by the incident light source in high refractive index all-dielectric metasurfaces. They can manipulate light waves to a certain extent and can be used in many fields. Silicon is widely used in all-dielectric metasurfaces due to its high refractive index and low loss in near infrared range. In this paper, we use silicon nanodisk structure as refractive index sensor and PDMS microfluidic channels as detection channels to realize liquid refractive index sensing. The magnetic resonance peak of the nanodisk structure is selected for sensing. The position of the magnetic resonance is shifted in the transmission spectrum with the change of the refractive index of the surrounding environment. When the refractive index increases, the resonance peak moves towards the long-wave direction, resulting in red shift, and vice versa. In this paper, the shift of resonance peak reaches 230 nm RIU−1. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/1838/1/012001Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 1838
- Journal Issue
- 1
- Journal Page Range
- [5 p.]
- ISSN
- 1742-6596
Conference
- Title
- 8. annual International Conference on Material Science and Environmental Engineering
- Acronym
- MSEE 2020
- Dates
- 20-21 Nov 2020
- Place
- Chengdu (China)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54052287
- Subject category
- S36: MATERIALS SCIENCE; S47: OTHER INSTRUMENTATION;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DETECTION; DIELECTRIC MATERIALS; MAGNETIC RESONANCE; RED SHIFT; REFRACTIVE INDEX; SENSORS; SILICON; SPECTRA
- Descriptors DEC
- ELEMENTS; MATERIALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RESONANCE; SEMIMETALS