Published March 1, 2021 | Version v1
Journal article

All-Dielectric Metasurface Refractive Index Sensor with Microfluidics

  • 1. State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou 310027 (China)

Description

Magnetic resonance and electrical resonance can be excited simultaneously by the incident light source in high refractive index all-dielectric metasurfaces. They can manipulate light waves to a certain extent and can be used in many fields. Silicon is widely used in all-dielectric metasurfaces due to its high refractive index and low loss in near infrared range. In this paper, we use silicon nanodisk structure as refractive index sensor and PDMS microfluidic channels as detection channels to realize liquid refractive index sensing. The magnetic resonance peak of the nanodisk structure is selected for sensing. The position of the magnetic resonance is shifted in the transmission spectrum with the change of the refractive index of the surrounding environment. When the refractive index increases, the resonance peak moves towards the long-wave direction, resulting in red shift, and vice versa. In this paper, the shift of resonance peak reaches 230 nm RIU−1. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/1838/1/012001

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
1838
Journal Issue
1
Journal Page Range
[5 p.]
ISSN
1742-6596

Conference

Title
8. annual International Conference on Material Science and Environmental Engineering
Acronym
MSEE 2020
Dates
20-21 Nov 2020
Place
Chengdu (China)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
54052287
Subject category
S36: MATERIALS SCIENCE; S47: OTHER INSTRUMENTATION;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DETECTION; DIELECTRIC MATERIALS; MAGNETIC RESONANCE; RED SHIFT; REFRACTIVE INDEX; SENSORS; SILICON; SPECTRA
Descriptors DEC
ELEMENTS; MATERIALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RESONANCE; SEMIMETALS