Time width signal processing method of radiation signal and its application to ASIC

Along with the recent development of semiconductor manufacturing technology, the fine imaging has become possible. The Application Specific Integrated Circuit (ASIC) to read out detector signals is now key technology for the fine imaging. Time over Threshold (ToT) method in ASIC has attracted attention in terms of its simplicity and wide dynamic range. However, in ToT method, the nonlinearity between peak value of voltage pulse and output time width is a bottleneck. In order to improve this nonlinearity, we developed dynamic time-over-threshold (dToT) method and Slew Rate Limited type ToT method. (author)