Published September 1983
| Version v1
Journal article
Computer simulation of MeV ion-surface backscattering
Description
A computer program is described which attempts to simulate closely the actual processes of energy loss, deflections and backscattering of ions in a crystalline solid. Results are reported of calculations for 1 MeV He ions incident on silicon close to a <110> direction, both for an unreconstructed surface and at a surface which has undergone a 2 x 1 reconstruction in a conjugated-chain model. The predicted backscattered spectra differ, but not in any simple way that may be identified with differences in surface structure. (author)
Additional details
Publishing Information
- Journal Title
- Radiat. Eff.
- Journal Volume
- 77
- Journal Issue
- 3-4
- Series
- Radiat. Eff.
- Journal Page Range
- 167-175
- ISSN
- 0033-7579
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 15005632
- Subject category
- S36: MATERIALS SCIENCE; S99: GENERAL AND MISCELLANEOUS;
- Descriptors DEI
- ANGULAR DISTRIBUTION; BACKSCATTERING; COMPUTERIZED SIMULATION; CRYSTAL LATTICES; ENERGY LOSSES; ENERGY SPECTRA; HELIUM IONS; ION COLLISIONS; MEV RANGE 01-10; PHYSICAL RADIATION EFFECTS; SILICON; SURFACES
- Descriptors DEC
- CHARGED PARTICLES; COLLISIONS; CRYSTAL STRUCTURE; DISTRIBUTION; ELEMENTS; ENERGY RANGE; IONS; MEV RANGE; RADIATION EFFECTS; SCATTERING; SEMIMETALS; SIMULATION; SPECTRA