Published October 23, 2008
| Version v1
Journal article
Inhomogeneity Induced Coupling in YBCO/BaTiO3 Composites
Description
Ferroelectric and high temperature superconducting materials are two promising materials for future electronic devices. The superconducting properties and the related microstructures of YBa2Cu3O7-δ with BaTiO3 addition, prepared by partial melt processing, were investigated with temperature-resistivity, X-ray diffraction and SEM-EDX analysis. For lower concentration of BaTiO3 it shows a fractal behaviour approaching the exponent of three-dimensional percolation model. The transport properties studied by four-probe arrangement show a different behaviour depending on the wt.% of ferroelectric to superconductor.
Additional details
Identifiers
- DOI
- 10.1063/1.3027188;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1063
- Journal Issue
- 1
- Journal Page Range
- p. 422-428
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- International workshop on mesoscopic, nanoscopic and macroscopic materials
- Acronym
- IWMNMM-2008
- Dates
- 2-4 Jan 2008
- Place
- Bhubaneswar (India)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41002937
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BARIUM OXIDES; COPPER OXIDES; ELECTRONIC EQUIPMENT; FERROELECTRIC MATERIALS; FRACTALS; HIGH-TC SUPERCONDUCTORS; MICROSTRUCTURE; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY; THREE-DIMENSIONAL CALCULATIONS; TITANATES; X-RAY DIFFRACTION; YTTRIUM OXIDES
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; BARIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; COPPER COMPOUNDS; DIELECTRIC MATERIALS; DIFFRACTION; ELECTRON MICROSCOPY; EQUIPMENT; MATERIALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SUPERCONDUCTORS; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TYPE-II SUPERCONDUCTORS; YTTRIUM COMPOUNDS
Optional Information
- Notes
- (c) 2008 American Institute of Physics