Published October 1, 2013 | Version v1
Journal article

Analytical possibilities of different X-ray fluorescence systems for determination of trace elements in aqueous samples pre-concentrated with carbon nanotubes

  • 1. Department of Chemistry, University of Girona, Campus Montilivi, 17071 Girona (Spain)
  • 2. Institute of Chemistry, University of Silesia, Szkolna 9, 40-006 Katowice (Poland)
  • 3. SPECTRO Analytical Instruments GmbH, Boschstr. 10, 47533 Kleve (Germany)
  • 4. Laboratory of X-Ray Analytical Applications, Institute of Earth Sciences Jaume Almera, CSIC, Solé Sabarís s/n, 08028 Barcelona (Spain)

Description

This study was aimed to achieve improved instrumental sensitivity and detection limits for multielement determination of V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Se, Pb and Cd in liquid samples by using different X-ray fluorescence (XRF) configurations (a benchtop energy-dispersive X-ray fluorescence spectrometer, a benchtop polarised energy-dispersive X-ray fluorescence spectrometer and a wavelength-dispersive X-ray fluorescence spectrometer). The preconcentration of metals from liquid solutions consisted on a solid-phase extraction using carbon nanotubes (CNTs) as solid sorbents. After the extraction step, the aqueous sample was filtered and CNTs with the absorbed elements were collected onto a filter paper which was directly analyzed by XRF. The calculated detection limits in all cases were in the low ng mL−1 range. Nevertheless, results obtained indicate the benefits, in terms of sensitivity, of using polarized X-ray sources using different secondary targets in comparison to conventional XRF systems, above all if Cd determination is required. The developed methodologies, using the aforementioned equipments, have been applied for multielement determination in water samples from an industrial area of Poland. - Highlights: • Use of carbon nanotubes for preconcentration of V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Se, Pb and Cd • Combination of this preconcentration procedure with different XRF systems • Benefit of using polarized X-ray sources for trace element determination

Availability note (English)

Available from http://dx.doi.org/10.1016/j.sab.2013.07.004

Additional details

Identifiers

DOI
10.1016/j.sab.2013.07.004;
PII
S0584-8547(13)00196-1;

Publishing Information

Journal Title
Spectrochimica Acta. Part B, Atomic Spectroscopy
Journal Volume
88
Journal Page Range
p. 192-197
ISSN
0584-8547
CODEN
SAASBH

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.