Ion beam modification and analysis of organometallics dispersed polymer films
- 1. Department of Physics, MS University of Baroda, Vadodara 390 002 (India)
- 2. Department of Chemistry, MS University of Baroda, Vadodara 390 002 (India)
- 3. Nuclear Science Centre, Aruna Asaf Ali Marg, New Delhi 110 067 (India)
- 4. UGC-DAE Consortium for Scientific Research, University Campus, Khandwa Road, Indore 452 017 (India)
Description
Thin films of polymethyl methacrylate (PMMA) were synthesized. Ferric oxalate was dispersed in PMMA films at various concentrations. These films were irradiated with 80 MeV O6+ ions at a fluence of 1 x 1011 ions/cm2. The radiation induced changes in electrical conductivity, microhardness, surface roughness are investigated in the paper. It is observed that hardness and electrical conductivity of the film increases with the concentration of dispersed ferric oxalate and also with the fluence. It indicates that ion beam irradiation promotes (i) the metal to polymer bonding (ii) convert the polymeric structure in to hydrogen depleted carbon network. Thus irradiation makes the polymer more hard and more conductive. Atomic force microscopy shows that average roughness (R a) of the irradiated film is lower than the unirradiated one
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2005.11.127;
- PII
- S0168-583X(05)01953-1;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 244
- Journal Issue
- 1
- Journal Page Range
- p. 235-238
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- Indo-German workshop on synthesis and modifications of nano-structured materials by energetic ion beams
- Dates
- 20-24 Feb 2005
- Place
- New Delhi (India)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37069682
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; BONDING; CARBON; ELECTRIC CONDUCTIVITY; HYDROGEN; ION BEAMS; IONS; IRRADIATION; METALS; METHACRYLATES; MEV RANGE 10-100; MICROHARDNESS; OXALATES; PMMA; ROUGHNESS; SURFACES; THIN FILMS
- Descriptors DEC
- BEAMS; CARBOXYLIC ACID SALTS; CHARGED PARTICLES; ELECTRICAL PROPERTIES; ELEMENTS; ENERGY RANGE; ESTERS; FABRICATION; FILMS; HARDNESS; JOINING; MECHANICAL PROPERTIES; MEV RANGE; MICROSCOPY; NONMETALS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PHYSICAL PROPERTIES; POLYACRYLATES; POLYMERS; POLYVINYLS; SURFACE PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.