Published September 1996
| Version v1
Journal article
X-ray fluorescence analysis with high energy resolution
Creators
- 1. National Synchrotron Light Source, Brookhaven National Laboratory, Upton, NY 11973 The University of Chicago and Center for Advanced Radiation Sources, Chicago, IL 60637 (United States)
Description
The analysis of x-ray fluorescence lines with total energy resolution of 1 eV or better can provide detailed information on the electronic structure of the sample in addition to quantitative elemental analysis of the sample. A perfect crystal spectrometer was developed for this purpose. Preliminary results from a series of chromium oxides will be presented. copyright 1996 American Institute of Physics
Additional details
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 67
- Journal Issue
- 9
- Journal Page Range
- p. 3359.
- ISSN
- 0034-6748
- CODEN
- RSINAK
Conference
- Title
- synchrotron radiation instrumentation symposium; 7. users meeting for the advanced photon source (APS).
- Acronym
- SRI '95
- Dates
- 16-20 Oct 1995.
- Place
- Argonne, IL (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 28011780
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BNL; CHROMIUM OXIDES; ENERGY RESOLUTION; NSLS; QUANTITATIVE CHEMICAL ANALYSIS; SPECTROMETERS; SYNCHROTRON RADIATION; USES; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- BREMSSTRAHLUNG; CHALCOGENIDES; CHEMICAL ANALYSIS; CHROMIUM COMPOUNDS; ELECTROMAGNETIC RADIATION; MEASURING INSTRUMENTS; NATIONAL ORGANIZATIONS; NONDESTRUCTIVE ANALYSIS; OXIDES; OXYGEN COMPOUNDS; RADIATION SOURCES; RADIATIONS; RESOLUTION; SYNCHROTRON RADIATION SOURCES; TRANSITION ELEMENT COMPOUNDS; US AEC; US DOE; US ERDA; US ORGANIZATIONS; X-RAY EMISSION ANALYSIS
Optional Information
- Secondary number(s)
- CONF-9510119--.