Pine shaped InN nanostructure growth via vapour transport method by own shadowing and infrared detection

We have demonstrated the synthesis of Indium Nitride (InN) Nanopines (NΠs) array on Si substrate using Oblique Angle Deposition (OAD) technique. The deposited InN NΠs have an average height of ∼2 μm. The grown InN NΠs are hexagonal in nature and have prominent diffraction peak along <002> orientation. The X-ray photoelectron spectroscopy (XPS) measurement confirms the presence of In−N bonds. An Optical absorption spectroscopy reveals high band gap absorption at approximately 1.15 eV. The carrier concentration of (∼1.8 × 10²⁰ cm⁻³) was determined using capacitance (C) – voltage (V) measurement. The infrared detection with maximum responsivity at 1.14 eV (∼1078 nm) was obtained near the optical band edge at 10 K. A low device sensitivity was observed with an increasing operating temperature. - Highlights: • A Unique technique has been developed to synthesis InN nanopines. • High quality InN was dominated by <002> orientation. • The XPS analysis revealed that the growth of pure phase InN. • High carrier concentration produced high optical band gap of InN. • Selective infrared wavelength detection at 1078 nm (1.14 eV) was obtained.