Observation of scintillation light spots for 20keV H- ion beams using glass viewer and digital camera and measurement of beam profiles using freeware ImageJ (II)
Creators
- 1. Laboratory for Materials Engineering with Quantum Beams, Tokyo (Japan)
- 2. Tokyo City University, Faculty of Engineering, Tokyo (Japan)
- 3. Tokyo City University, Cooperative Major in Nuclear Energy, Tokyo (Japan)
Description
In the previous symposium, we reported that we could take the picture of scintillation light spots for H- ions with such a low energy as 20keV using a glass viewer and a digital camera and quickly deduce the beam profiles from the obtained pictures using a famous freeware ImageJ in biology and medical science. In this report, in order to resolve the problem that H- ions extracted from the hole on the anode are bent by the stray magnetic field of Permanent Magnets for Penning discharge and they depart from the central axis of the Einzel lens by introducing a compact dipole magnet to correct the ion orbit right, we measured the beam profiles of H- ion beams on 0deg Course Viewer focused by the voltages of Einzel lens (Vein=-12.5kV, -13.0kV, -13.5kV, -14.0kV and -14.5kV) at 2, 3, 5 Permanent Magnets using the obtained methods and showed ImageJ Surface Plot 2D Presentations, Intensity Distributions for x axis and for y axis of these beam profiles. (author)
Additional details
Publishing Information
- Journal Title
- Tokyo Toshi Daigaku Genshiryoku Kenkyusho Kenkyusho-Ho
- Journal Issue
- no.45
- Series
- 雑誌名:東京都市大学原子力研究所研究所報
- Journal Page Range
- p. 3-6
- ISSN
- 2185-4025
Conference
- Title
- 37. symposium on materials science and engineering, Research Center of Ion Beam Technology, Hosei University
- Dates
- 5 Dec 2018
- Place
- Koganei, Tokyo (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 51030140
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM MONITORS; BEAM PROFILES; HYDROGEN IONS 1 MINUS; ION BEAMS; ION SOURCES; MAGNETIC FIELDS; PELLETRON ACCELERATORS; PENNING DISCHARGES; PERMANENT MAGNETS; PIXE ANALYSIS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCINTILLATIONS
- Descriptors DEC
- ACCELERATORS; ANIONS; BEAMS; CHARGED PARTICLES; CHEMICAL ANALYSIS; ELECTRIC DISCHARGES; ELECTROSTATIC ACCELERATORS; EQUIPMENT; HYDROGEN IONS; IONS; MAGNETS; MEASURING INSTRUMENTS; MONITORS; NONDESTRUCTIVE ANALYSIS; SPECTROSCOPY; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 7 refs., 2 figs.