Published June 2019
| Version v1
Journal article
X-ray production cross sections induced by neon ions
Creators
- 1. Institute of Nuclear Physics 050032, Ibragimov 1, Almaty (Kazakhstan)
- 2. L.N. Gumilyov Eurasian National University, Mirzoyan 2, Astana (Kazakhstan)
- 3. Ural Federal University, Yekaterinburg 620002 (Russian Federation)
Description
Cross sections for K, L, and M x-ray production in thin metal films excited by neon ions with projectile energies from 16 to 32 MeV for the elements from Ti to Bi were measured. The X-ray production calculations were performed through the Rutherford backscattering cross sections, which can be obtained from the Rutherford formula with high accuracy. The obtained results were compared with the predictions of the ECPSSR and PWBA theories calculated using the ISICS program.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2019.03.060Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2019.03.060;
- PII
- S0168583X19301843;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 448
- Journal Page Range
- p. 19-25
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54123161
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BORN APPROXIMATION; CROSS SECTIONS; METALS; NEON IONS; PIXE ANALYSIS; PROJECTILES; RUTHERFORD BACKSCATTERING SPECTROSCOPY; THIN FILMS; X RADIATION
- Descriptors DEC
- APPROXIMATIONS; CALCULATION METHODS; CHARGED PARTICLES; CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; IONIZING RADIATIONS; IONS; NONDESTRUCTIVE ANALYSIS; RADIATIONS; SPECTROSCOPY; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2019 Elsevier B.V. All rights reserved.