Published December 15, 2009 | Version v1
Journal article

Structural distortions in nitrogen-doped GaP and GaAs

  • 1. Saint-Petersburg Mining Institute, Technical University (Russian Federation)

Description

Using the tight-binding approximation we investigated the effect of structural relaxation on nitrogen-induced states in GaP and GaAs. We show that deformation energies of the impurity depend on mutual orientation of nitrogen atoms and possibilities for them to relax. The calculated deformation energies that allowed us to remove the strain by changing atomic positions can determine the final position of cluster states. We show that the lowest nitrogen bound state is associated with the [1 1 0] nitrogen pair, while the upper bound state corresponds to the [2 0 0] pair. The contribution of Γ, L and X conduction band minimums into nitrogen-induced states is evaluated.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physb.2009.08.266

Additional details

Identifiers

DOI
10.1016/j.physb.2009.08.266;
PII
S0921-4526(09)00985-5;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
404
Journal Issue
23-24
Journal Page Range
p. 4984-4987
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
25. international conference on defects in semiconductors
Dates
20-24 Jul 2009
Place
St. Petersburg (Russian Federation)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41089712
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
APPROXIMATIONS; BOUND STATE; CRYSTAL DEFECTS; DEFORMATION; DOPED MATERIALS; ENERGY LEVELS; GALLIUM ARSENIDES; GALLIUM PHOSPHIDES; IMPURITIES; NITROGEN ADDITIONS; RELAXATION; STRAINS
Descriptors DEC
ALLOYS; ARSENIC COMPOUNDS; ARSENIDES; CALCULATION METHODS; CRYSTAL STRUCTURE; GALLIUM COMPOUNDS; MATERIALS; PHOSPHIDES; PHOSPHORUS COMPOUNDS; PNICTIDES

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.