Published May 15, 2000 | Version v1
Journal article

Phase-contrast x-ray microscopy with a point focus x-ray source

  • 1. Factory of Science, Himeji Institute of Technology, 3-2-1 Kouto, Kamigori, Ako, Hyogo, 678-1297 (Japan)
  • 2. Department of Radiology, Kobe University, 7-5-2 Kusunokicho, Chuo-ku, Kobe, Hyogo, 650-0017 (Japan)

Description

Phase-contrast x-ray microscopy has been performed using a point focus x-ray source. The method is essentially the projection microscopy, but the contrast enhancement due to the refraction is obtained by taking a certain sample-detector distance large enough to spatially resolve phase gradients in the x-ray beam. The spatial resolution was measured to be 2.5 μm in horizontal and 2.2 μm in vertical directions. A phase contrast image of a glass tube was taken, and the contrast enhancement was clearly observed in boundary regions. The phase contrast images of a butterfly and a mosquito were also taken. It was confirmed that this method was useful to observe samples composed of light elements such as insects

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
507
Journal Issue
1
Journal Page Range
p. 416-419
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
6. international conference on X-ray microscopy
Dates
2-6 Aug 1999
Place
Berkeley, CA (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35069990
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S60: APPLIED LIFE SCIENCES;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DIAGNOSIS; IMAGES; INSECTS; MICROSCOPY; MOSQUITOES; PATIENTS; REFRACTION; SPATIAL RESOLUTION; X RADIATION; X-RAY DETECTION; X-RAY SOURCES
Descriptors DEC
ANIMALS; ARTHROPODS; DETECTION; DIPTERA; ELECTROMAGNETIC RADIATION; INSECTS; INVERTEBRATES; IONIZING RADIATIONS; RADIATION DETECTION; RADIATION SOURCES; RADIATIONS; RESOLUTION

Optional Information

Notes
(c) 2000 American Institute of Physics.