Development of a compact and precise ion irradiation system
Description
A compact and precise ion irradiation system has been developed to study the mechanism of radiation effects on materials and devices. This system has been constructed on the basis of a 200 keV ion implanter, and together with precise lenses and deflectors it produces a beam of a single ion (i.e. one ion in one pulse), 1 ns in pulse width and 1 μm in diameter. To monitor the beam position, a quadrant-type electrode with a hole in its center was placed at the entrance to beam focusing components. Also an automatic beam adjustment system based on an optimization method was introduced for aid in the operation of the accelerator. Moreover, a beam control system connecting with 'internet' is on trial for users to operate this irradiation system remotely
Additional details
Identifiers
- PII
- S0168583X03010000;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 210
- Journal Issue
- 1
- Journal Page Range
- p. 37-41
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 8. international conference on nuclear microprobe technology and applications
- Dates
- 8-13 Sep 2002
- Place
- Takasaki (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34077575
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCELERATORS; ACCURACY; BEAM MONITORING; BEAM PULSERS; COMPUTER NETWORKS; COMPUTERIZED CONTROL SYSTEMS; ION BEAMS; ION IMPLANTATION; ION SELECTIVE ELECTRODE ANALYSIS; ION SOURCES; IRRADIATION DEVICES; KEV RANGE 100-1000; LENSES; OPTIMIZATION; PHYSICAL RADIATION EFFECTS; REMOTE HANDLING
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; CONTROL SYSTEMS; ENERGY RANGE; KEV RANGE; MONITORING; ON-LINE CONTROL SYSTEMS; ON-LINE SYSTEMS; RADIATION EFFECTS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.