Published June 17, 2009 | Version v1
Journal article

Patterning of self-assembled monolayers based on differences in molecular conductance

  • 1. EaStCHEM School of Chemistry, University of St Andrews, St Andrews KY16 9ST (United Kingdom)

Description

Scanning tunneling microscopy (STM) is used for replacement patterning of self-assembled monolayers (SAMs) of thiols on a sub-10 nm scale. Contrasting other schemes of scanning probe patterning of SAMs, the exchange of molecules relies on differences in conductance and, thus, occurs under tunneling conditions where the resolution of the tip is maintained. Exchange takes place at the boundary between different thiols but only when the tip moves from areas of lower to higher conductance. In combination with SAMs which exhibit excellent structural quality, patterns with a contour definition of ± 1 molecule, lines as thin as 2.5 nm and islands with an area of less than 20 nm2 are straightforwardly produced. It is suggested that the shear force exerted onto the molecules with the lower conductance triggers displacement of the one with higher conductance.

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/20/24/245306

Additional details

Identifiers

DOI
10.1088/0957-4484/20/24/245306;
PII
S0957-4484(09)10662-1;

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
20
Journal Issue
24
Journal Page Range
[6 p.]
ISSN
0957-4484

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41017307
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
NANOSTRUCTURES; SCANNING TUNNELING MICROSCOPY; SHEAR; THIOLS; TUNNEL EFFECT
Descriptors DEC
MICROSCOPY; ORGANIC COMPOUNDS; ORGANIC SULFUR COMPOUNDS