Published 1999 | Version v1
Book

Structural characteristics and quantum chemistry calculation of Si-doped boron carbides

Description

Structural characteristics, chemical bonds and thermoelectric properties of Si-doped boron carbides are studied through calculations of various structural unit models by using a self-consistent-field discrete variation Xα method. The calculations show that Si atom doped in boron carbide is in preference to substituting B or C atoms on the end of boron carbide chain, and then may occupy interstitial sites, but it is difficult for Si to substitute B or C atom in the centers of chain or in the icosahedra. A representative structural unit containing a Si atom is [C-B-Si]ε+-[B11C]ε-, while the structural unit without Si is [C-B-B(C)]δ'-[B11C]δ+, and the coexistence of these two different structural units makes the electrical conductivity increases. As the covalent bond of Si-B or Si-C is weaker than that of B-B or B-C, the thermal conductivity decreases when Si is added into boron carbides. With the electrical conductivity increases and the thermal conductivity decreases, Si doping has significant effect on thermoelectric properties of boron carbides

Additional details

Publishing Information

Publisher
Materials Research Society
Imprint Place
Warrendale, PA (United States)
ISBN
1-55899-444-0
Imprint Title
Multiscale modeling of materials. Materials Research Society symposium proceedings: Volume 538
Imprint Pagination
607 p.
Journal Page Range
p. 579-584
ISSN
0272-9172

Conference

Title
Multiscale Modeling of Materials
Dates
30 Nov - 3 Dec 1998
Place
Boston, MA (United States)

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
31023844
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
BORON CARBIDES; CHEMICAL BONDS; CRYSTAL STRUCTURE; MATHEMATICAL MODELS; PHYSICAL PROPERTIES; SILICON ADDITIONS; THEORETICAL DATA
Descriptors DEC
BORON COMPOUNDS; CARBIDES; CARBON COMPOUNDS; DATA; INFORMATION; NUMERICAL DATA

Optional Information

Notes
Imprint:Single article reprints are available through University Microfilms Inc., 300 North Zeeb Rd., Ann Arbor, Michigan 48106 (US)