Published April 1, 1981 | Version v1
Journal article Metadata-only

An assessment of instrumental parameters which control the accuracy of stress measurement using the X-ray diffractometer method

Creators

  • 1. Central Electricity Generating Board, Gravesend (UK). Scientific Services Dept.

Description

The sources of systematic error in the X-ray diffractometer method of stress measurement are discussed. The errors in stress measurement and correction procedures for their elimination are described and quantitatively assessed. (Auth.)

Additional details

Publishing Information

Journal Title
J. Appl. Crystallogr.
Journal Volume
14
Journal Issue
2
Series
J. Appl. Crystallogr.
Journal Page Range
124-130
ISSN
0021-8898

INIS

Country of Publication
Denmark
Country of Input or Organization
Denmark
INIS RN
12627461
Subject category
S07: ISOTOPES AND RADIATION SOURCES;
Descriptors DEI
ACCURACY; CRYSTALLOGRAPHY; ERRORS; STRESS ANALYSIS; STRESSES; X RADIATION; X-RAY DIFFRACTOMETERS
Descriptors DEC
DIFFRACTOMETERS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; RADIATIONS