Published December 2019 | Version v1
Journal article

Scheme of high-resolution identification and selection of secondary ions for mass measurements with the Rare-RI Ring

  • 1. Chinese Academy of Sciences, Institute of Modern Physics (China)
  • 2. RIKEN, RIKEN Nishina Center (Japan)
  • 3. Saitama University, Department of Physics (Japan)
  • 4. University of Tsukuba, Institute of Physics (Japan)

Description

To achieve high-resolution selection and separation of mono-isotopic beams through projectile fragmentation or in-flight fission and to efficiently transport the secondary beams to the Rare-RI Ring (R3) for mass determination, the BigRIPS separator combined with the High-resolution Achromatic (HA) beam-line of SHARAQ is served as a two-stage separator. The first stage from F0 to F2 is used for separation of the nuclei of interest through a Bρ-ΔE-Bρ method and the second stage from F3 to S0 is employed for identification of the beam with a Bρ-ΔE-TOF method. With this scheme, all the secondary ions can be well separated on an event by event basis and be utilized for mass measurements by two complementary methods: the conventional magnetic-rigidity-time-of-flight (Bρ-TOF) method employing the BigRIPS-HA beam-line to measure exotic nuclides within 1 μ s and the newly established isochronous mass spectrometry (IMS) approach via the R3 with a measurement duration less than 1 ms. This report presents the technique advances of the BigRIPS-HA-SHARAQ-R3 as a separator/spectrometer and give a brief description of its application to the complementary TOF methods for mass measurements at RIBF.

Additional details

Identifiers

Publishing Information

Journal Title
Hyperfine Interactions
Journal Volume
240
Journal Issue
1
Journal Page Range
p. 1-11
ISSN
0304-3843
CODEN
HYINDN

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
51081201
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
FISSION; FRAGMENTATION; MAGNETIC RIGIDITY; MASS; MASS SPECTROSCOPY; RESOLUTION; SECONDARY BEAMS; SPECTROMETERS; TIME-OF-FLIGHT METHOD
Descriptors DEC
BEAMS; MEASURING INSTRUMENTS; NUCLEAR REACTIONS; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2019 The Author(s)