Published July 15, 2008 | Version v1
Journal article

Negative-U property of interstitial hydrogen in GaAs

  • 1. Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32-46, 02-668 Warsaw (Poland)
  • 2. Department of Physics and Astronomy, University of Aarhus, DK-8000 Aarhus C (Denmark)

Description

We identify the donor level of interstitial hydrogen in GaAs, which is characterized by the activation enthalpy EC-Et=0.13 eV. This level is the marker of two different but closely related defect structures, which are indistinguishable as far as their emission properties are concerned; however, discernible on the basis of their different dynamical behaviors are revealed by annealing studies. We interpret the two structures as regular bond center hydrogen H(BC) and bond center hydrogen H(BC'), which is perturbed by the local strain from a neighbor point defect. We demonstrate negative-U properties of the perturbed structure and infer that the corresponding acceptor H(T') lies deep in the band gap. These results for interstitial hydrogen in GaAs are in every aspect analogous to the properties of interstitial hydrogen in Si

Additional details

Identifiers

Publishing Information

Journal Title
Physical Review. B, Condensed Matter and Materials Physics
Journal Volume
78
Journal Issue
3
Journal Page Range
p. 035211-035211.7
ISSN
1098-0121

Optional Information

Notes
(c) 2008 The American Physical Society