Published October 20, 2014 | Version v1
Journal article

Understanding pop-ins in spherical nanoindentation

  • 1. MPA-CINT Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
  • 2. Empa, Swiss Federal Laboratory for Materials Testing and Research, Laboratory for Mechanics of Materials and Nanostructures, Feuerwerkerstrasse 39, Thun 3602 (Switzerland)
  • 3. George W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332 (United States)

Description

Pop-ins, or sudden displacement-bursts at constant load in a nanoindentation test, are typically attributed to the difficulty of setting up potent dislocation sources in the very small indentation zones in these experiments. Such displacement (and strain) bursts would intuitively indicate a sharp drop in stress during the pop-in event itself. However, spherical indentation stress-strain curves routinely exhibit a high and stable indentation stress value during the pop-in, and the indentation stresses decrease only after a further finite amount of additional indentation displacement has been applied. In order to understand this discrepancy, we utilize a combination of interrupted spherical indentation tests along with depth profiling of the residual indentation surfaces using in-situ atomic force microscopy (AFM) to study pop-ins. The AFM surface profile maps show that there is an asymmetric profile change over a limited region around the indentation contact area for a single pop-in; the asymmetry disappears upon further loading beyond the pop-in. A plausible sequence of physical processes (related to metal plasticity) occurring underneath the indenter during and immediately after the occurrence of the pop-in is proposed to explain these observations.

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
105
Journal Issue
16
Journal Page Range
p. 161913-161913.5
ISSN
0003-6951
CODEN
APPLAB

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46057289
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
ASYMMETRY; ATOMIC FORCE MICROSCOPY; DISLOCATIONS; METALS; NANOSTRUCTURES; PLASTICITY; SPHERICAL CONFIGURATION; STRAINS; STRESSES; SURFACES
Descriptors DEC
CONFIGURATION; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTS; LINE DEFECTS; MECHANICAL PROPERTIES; MICROSCOPY

Optional Information

Notes
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