Multielement analysis of rice flour-unpolished reference material by instrumental neutron activation analysis
Creators
- 1. Musashi Inst. of Tech., Kawasaki, Kanagawa (Japan). Atomic Energy Research Lab.
Description
Trace elements in NIES certified reference material No. 10-a∼10-c Rice Flour-Unpolished, prepared by the National Institute for Environmental Studies of Japan (NIES), were determined by instrumental neutron activation analysis (INAA). A set of three samples with different Cd concentration levels was subjected to analyses. Portions of each sample (ca. 200∼1000 mg) were irradiated, either with thermal neutrons without cadmium filter or with epithermal neutrons with cadmium filter, in the Musashi Institute of Technology Research Reactor (MITRR). The activated samples were analyzed by the three methods; conventional γ-ray spectrometry using a coaxial Ge detector, anticoincidence counting spectrometry, and coincidence counting spectrometry using a coaxial Ge detector and a well type NaI(Tl) detector. Concentrations of 26∼28 elements were determined by these methods. The values obtained for many elements, except for Mg and K, were in good agreement with those of the NIES certified and reference. Concentrations of 10 elements (S, Sc, V, Ag, Sb, Cs, Ba, La, Sm, Th), whose certified or reference values are not available from NIES, were also determined in this work. (author)
Additional details
Publishing Information
- Journal Title
- Bunseki Kagaku (Japan Analyst)
- Journal Volume
- 39
- Journal Issue
- 5
- Series
- Bunseki Kagaku.
- Journal Page Range
- 255-260
- ISSN
- 0525-1931
- CODEN
- BNSKA
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 21085867
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ACTIVATION ANALYSIS; ANTICOINCIDENCE; CADMIUM; CALIBRATION STANDARDS; COINCIDENCE SPECTROMETRY; GAMMA SPECTROMETERS; IRRADIATION; NEUTRONS; POWDERS; RICE; SENSITIVITY
- Descriptors DEC
- BARYONS; CEREALS; CHEMICAL ANALYSIS; COINCIDENCE METHODS; COUNTING TECHNIQUES; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; GRAMINEAE; HADRONS; MEASURING INSTRUMENTS; METALS; NONDESTRUCTIVE ANALYSIS; NUCLEONS; PLANTS; SPECTROMETERS