Published February 2013 | Version v1
Journal article

Shallow-donor lasers in uniaxially stressed silicon

  • 1. Russian Academy of Sciences, Institute for Physics of Microstructures (Russian Federation)
  • 2. Leibniz Institute for Crystal Growth (Germany)
  • 3. DLR, Institute of Planetary Research (Germany)

Description

The effects of the terahertz-stimulated emission of Group-V donors (phosphorus, antimony, arsenic, bismuth) in uniaxially stressed silicon, excited by CO2 laser radiation are experimentally studied. It is shown that uniaxial compressive stress of the crystal along the [100] direction increases the gain and efficiency of stimulated radiation, significantly decreasing the threshold pump intensity. The donor frequencies are measured and active transitions are identified in stressed silicon. The dependence of the residual population of active donor states on the uniaxial compressive stress along the [100] direction is theoretically estimated.

Additional details

Identifiers

Publishing Information

Journal Title
Semiconductors
Journal Volume
47
Journal Issue
2
Journal Page Range
p. 235-241
ISSN
1063-7826
CODEN
SMICES

Conference

Title
9. international conference 'Silicon-2012'; 8. school for young scientists
Acronym
Silicon 2012
Dates
9-13 Jul 2012
Place
St. Petersburg (Russian Federation)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44063383
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANTIMONY; ARSENIC; BISMUTH; CARBON DIOXIDE LASERS; CRYSTALS; EFFICIENCY; PHOSPHORUS; SILICON; STIMULATED EMISSION; STRESSES
Descriptors DEC
ELEMENTS; EMISSION; ENERGY-LEVEL TRANSITIONS; GAS LASERS; LASERS; METALS; NONMETALS; SEMIMETALS

Optional Information

Copyright
Copyright (c) 2013 Pleiades Publishing, Ltd.