Published February 2013
| Version v1
Journal article
Shallow-donor lasers in uniaxially stressed silicon
Creators
- 1. Russian Academy of Sciences, Institute for Physics of Microstructures (Russian Federation)
- 2. Leibniz Institute for Crystal Growth (Germany)
- 3. DLR, Institute of Planetary Research (Germany)
Description
The effects of the terahertz-stimulated emission of Group-V donors (phosphorus, antimony, arsenic, bismuth) in uniaxially stressed silicon, excited by CO2 laser radiation are experimentally studied. It is shown that uniaxial compressive stress of the crystal along the [100] direction increases the gain and efficiency of stimulated radiation, significantly decreasing the threshold pump intensity. The donor frequencies are measured and active transitions are identified in stressed silicon. The dependence of the residual population of active donor states on the uniaxial compressive stress along the [100] direction is theoretically estimated.
Additional details
Identifiers
Publishing Information
- Journal Title
- Semiconductors
- Journal Volume
- 47
- Journal Issue
- 2
- Journal Page Range
- p. 235-241
- ISSN
- 1063-7826
- CODEN
- SMICES
Conference
- Title
- 9. international conference 'Silicon-2012'; 8. school for young scientists
- Acronym
- Silicon 2012
- Dates
- 9-13 Jul 2012
- Place
- St. Petersburg (Russian Federation)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44063383
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANTIMONY; ARSENIC; BISMUTH; CARBON DIOXIDE LASERS; CRYSTALS; EFFICIENCY; PHOSPHORUS; SILICON; STIMULATED EMISSION; STRESSES
- Descriptors DEC
- ELEMENTS; EMISSION; ENERGY-LEVEL TRANSITIONS; GAS LASERS; LASERS; METALS; NONMETALS; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2013 Pleiades Publishing, Ltd.