Extraordinary refraction and self-collimation properties of multilayer metallic-dielectric stratified structures
Creators
- 1. School of Physics and Chemistry, Henan Polytechnic University, Jiaozuo 454000 (China)
- 2. School of Science, Chongqing Jiaotong University, Chongqing 400074 (China)
- 3. Guizhou Aerospace Institute of Measuring and Testing Technology, Guiyang 550009 (China)
Description
The extraordinary refraction with negative or zero refraction angle of the layered metamaterial consisting of alternating dielectric and plasmonic layers is theoretically studied. It is shown that the electromagnetic properties can be tuned by the filling factor, the permittivity of the dielectric layer and the plasma frequency of the metallic layer. At different frequency, the layered structures possess different refraction properties with positive, zero or negative refraction angle. By choosing appropriate parameters, positive-to-zero-to-negative-to positive refraction at the desired frequency can be realized. At the frequency with flat equal frequency contour, self-collimation and slow light properties are also found. Such properties can be used in the performance of negative refraction, subwavelength imaging and information propagation
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2014.10.012Additional details
Identifiers
- DOI
- 10.1016/j.physb.2014.10.012;
- PII
- S0921-4526(14)00800-X;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 457
- Journal Page Range
- p. 269-274
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46120689
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- DIELECTRIC MATERIALS; ELECTROMAGNETISM; LANGMUIR FREQUENCY; LAYERS; PERMITTIVITY; REFRACTION
- Descriptors DEC
- DIELECTRIC PROPERTIES; ELECTRICAL PROPERTIES; MAGNETISM; MATERIALS; PHYSICAL PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.