Effect of UV-radiation on track etch parameters of CR-39 plastic track detectors

CR-39 track detectors have been irradiated with 239Pu source at nuclear physics laboratory B.H.U. Varanasi, to investigate the track recording properties of the detector. The bulk etch rate is determined by measuring the change in thickness before and after etching, and track etch rate is determined by measuring the change in track length. Other track parameters such as diameter and sensitivity of the plastic detector are also determined. Another set of CR-39 plastic detector is irradiated by 239Pu source and exposed by UV-radiation after irradiation to see the effect of UV-rays on track etches parameters. All detectors were etched in 6.25 N NaOH solution at different temperatures for different hours and all track parameters are measured by optical microscope (Olympus BH-2, magnification 600x). After etching in 6.25 N NaOH solution we see that bulk etch rate, track etch rate and track diameter increased in the case of UV-radiation exposed CR-39 plastics detectors. (author)