Published April 1984 | Version v1
Journal article

Ion--surface interactions during thin film deposition

Creators

  • 1. Ion Beam Engineering Experimental Laboratory, Kyoto University, Sakyo, Kyoto 606, Japan

Description

The interactions of ion beams with surfaces are strongly dependent on the incident kinetic energy and the amount of ionic charge. Fundamental effects of ion bombardment by atomic and cluster ion beams have been elucidated in terms of kinetic energy of the ion beams. These fundamental effects include enhancement of adatom migration, desorption of physically absorbed atoms, displacement of the surface atoms, sputtering, shallow ion implantation, and trapping of impinging atoms. The importance of low energy ion beams for film formation is shown by taking into account the binding energies of the atoms in a solid. Emphasis has been placed on interactions of ionized cluster beams (ICB) during film formation because ICB offers unique capabilities for deposition due to the properties of the clusters and also to characteristic low energy ion beam transport over a range from thermal energy to a few hundred eV

Additional details

Publishing Information

Journal Title
J. Vac. Sci. Technol., A
Journal Volume
2
Journal Issue
2
Series
J. Vac. Sci. Technol., A.
Journal Page Range
382-388
ISSN
0734-2101

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
16003928
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Descriptors DEI
ADSORPTION; CHARGED-PARTICLE TRANSPORT; COLLISIONS; DEPOSITION; DESORPTION; FABRICATION; ION BEAMS; ION COLLISIONS; ION IMPLANTATION; KINETIC ENERGY; POPULATION DYNAMICS; SPUTTERING; THIN FILMS; TRAPPING
Descriptors DEC
BEAMS; ENERGY; FILMS; RADIATION TRANSPORT