On the influence of silicon oxide nanoparticles on the optical and surface properties of hybrid (inorganic-organic) barrier materials
- 1. Aristotle University of Thessaloniki, Department of Physics, Laboratory for Thin Films - Nanosystems and Nanometrology, GR-54124, Thessaloniki (Greece)
- 2. Fraunhofer-Institut fuer Silicatforschung, 97082 Wuerzburg (Germany)
Description
One of the major scientific and technological challenges for the production of flexible organic electronic devices is the device protection against atmospheric molecule permeation, which causes corrosion reducing its operation and lifetime. In this work, Spectroscopic Ellipsometry has been implemented to investigate the influence of silicon dioxide nanoparticles on the optical properties of hybrid polymers. The spectra analysis revealed valuable information about the electronic and vibrational response as well as the cross-linking mechanisms of these materials. The correlation of the optical properties with the synthesis parameters and the barrier response will contribute towards their optimization in order to be used as high barrier coatings for flexible organic electronics applications.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2009.02.114Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2009.02.114;
- PII
- S0040-6090(09)00351-4;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 517
- Journal Issue
- 23
- Journal Page Range
- p. 6275-6279
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 6. symposium on thin films for large area electronics
- Acronym
- E-MRS 2008 spring meeting
- Dates
- 26-30 May 2008
- Place
- Strasbourg (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42054615
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COATINGS; CORROSION; CROSS-LINKING; ELECTRONIC EQUIPMENT; ELLIPSOMETRY; INFORMATION; NANOSTRUCTURES; OPTICAL PROPERTIES; OPTIMIZATION; POLYMERS; SAFETY; SILICON OXIDES; SPECTRA; SURFACE PROPERTIES; SYNTHESIS
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL REACTIONS; EQUIPMENT; MEASURING METHODS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; POLYMERIZATION; SILICON COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.