Published October 1, 2009 | Version v1
Journal article

On the influence of silicon oxide nanoparticles on the optical and surface properties of hybrid (inorganic-organic) barrier materials

  • 1. Aristotle University of Thessaloniki, Department of Physics, Laboratory for Thin Films - Nanosystems and Nanometrology, GR-54124, Thessaloniki (Greece)
  • 2. Fraunhofer-Institut fuer Silicatforschung, 97082 Wuerzburg (Germany)

Description

One of the major scientific and technological challenges for the production of flexible organic electronic devices is the device protection against atmospheric molecule permeation, which causes corrosion reducing its operation and lifetime. In this work, Spectroscopic Ellipsometry has been implemented to investigate the influence of silicon dioxide nanoparticles on the optical properties of hybrid polymers. The spectra analysis revealed valuable information about the electronic and vibrational response as well as the cross-linking mechanisms of these materials. The correlation of the optical properties with the synthesis parameters and the barrier response will contribute towards their optimization in order to be used as high barrier coatings for flexible organic electronics applications.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2009.02.114

Additional details

Identifiers

DOI
10.1016/j.tsf.2009.02.114;
PII
S0040-6090(09)00351-4;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
517
Journal Issue
23
Journal Page Range
p. 6275-6279
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
6. symposium on thin films for large area electronics
Acronym
E-MRS 2008 spring meeting
Dates
26-30 May 2008
Place
Strasbourg (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42054615
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COATINGS; CORROSION; CROSS-LINKING; ELECTRONIC EQUIPMENT; ELLIPSOMETRY; INFORMATION; NANOSTRUCTURES; OPTICAL PROPERTIES; OPTIMIZATION; POLYMERS; SAFETY; SILICON OXIDES; SPECTRA; SURFACE PROPERTIES; SYNTHESIS
Descriptors DEC
CHALCOGENIDES; CHEMICAL REACTIONS; EQUIPMENT; MEASURING METHODS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; POLYMERIZATION; SILICON COMPOUNDS

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.