Published January 1975
| Version v1
Journal article
The use of secondary ion mass spectrometry in surface analysis
Description
no abstract available
Additional details
Identifiers
Publishing Information
- Journal Title
- Surface Science
- Journal Volume
- 47
- Journal Issue
- 1
- Series
- Surf. Sci.
- Journal Page Range
- 301-323
- ISSN
- 0039-6028
Conference
- Title
- 3. international symposium on surface physics.
- Dates
- 26 Jun 1974.
- Place
- Utrecht, The Netherlands.
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 6183414
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHEMICAL COMPOSITION; CRYSTAL STRUCTURE; ION BEAMS; IONIZATION; IONS; MASS SPECTRA; MASS SPECTROSCOPY; NONDESTRUCTIVE ANALYSIS; SECONDARY EMISSION; SOLIDS; SPUTTERING; SURFACES
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; CHEMICAL ANALYSIS; EMISSION; SPECTRA; SPECTROSCOPY
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent