Presentation of a flexible test station for the development and quality assurance of highly irradiated silicon strip sensors

Published 2010 | Version v1

Journal article Metadata-only

1. Institut fuer Experimentelle Kernphysik, Karlsruher Institut fuer Technologie (Germany)

no abstract available

Additional details

Original title (German): Vorstellung einer flexiblen Teststation fuer die Entwicklung und Qualitaetssicherung von hochbestrahlten Silizium-Streifen-Sensoren

Journal Title: Verhandlungen der Deutschen Physikalischen Gesellschaft
Journal Issue: Bonn 2010 issue
Series: Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 45(2)
Journal Page Range: [1 p.]
ISSN: 0420-0195
CODEN: VDPEAZ

Title: 74. Annual meeting with ordinary general meeting of the DPG and 2010 Spring meeting with the professional associations extraterrestrial physics, gravitation and theory of relativity, hadrons and nuclei, particle physics, theoretical and mathematical fundamentals of the physics, the working teams equal opportunities, energy, the working groups information, young DPG, philosophy of the physics, physics and disarmament, symposia industry and book exhibition
Original Conference Title: 74. Jahrestagung mit Ordentlicher Mitgliederversammlung der DPG und Fruehjahrstagung 2010 mit den Fachverbaenden Extraterrestrische Physik, Gravitation und Relativitaetstheorie, Hadronen und Kerne, Teilchenphysik, Theoretische und Mathematische Grundlagen der Physik, den Arbeitskreisen Chancengleichheit, Energie, den Arbeitsgruppen junge DPG, Information, Philosophie der Physik, Physik und Abruestung, Symposien Industrie- und Buchausstellung
Dates: 15-19 Mar 2010
Place: Bonn (Germany)

Country of Publication: Germany
Country of Input or Organization: Germany
INIS RN: 42006639
Subject category: S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator: Conference, No Abstract
Descriptors DEI: AUTOMATION; PHYSICAL RADIATION EFFECTS; POSITION SENSITIVE DETECTORS; QUALITY ASSURANCE; SENSORS; SI MICROSTRIP DETECTORS; TEMPERATURE CONTROL; TEST FACILITIES
Descriptors DEC: CONTROL; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATION EFFECTS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS