Published June 1, 1999 | Version v1
Journal article

Electrodynamic c-axis properties of YBa2Cu3O7-δ thin films in the THz frequency regime

  • 1. Max-Planck-Institut fuer Festkoerperforschung, Stuttgart (Germany)
  • 2. Kansai Advanced Research Center, Communications Research Lab., Kobe (Japan)
  • 3. Research Center for Superconducting Materials and Electronics, Osaka Univ., Suita, Osaka (Japan)
  • 4. NTT LSI Labs., Atsugi-shi, Kanagawa (Japan)

Description

Using coherent THz pulse spectroscopy, we have analyzed the electrodynamic properties of thin YBa2Cu3O7-δ films in the temperature range between 10 and 300 K. The temperature dependence of the London penetration depth in c-axis direction determined from the complex conductivity yields clear evidence for d-wave symmetry of the order parameter. (orig.)

Additional details

Publishing Information

Journal Title
Physica Status Solidi. B, Basic Research
Journal Volume
213
Journal Issue
2
Journal Page Range
p. 405-413
ISSN
0370-1972
CODEN
PSSBBD

Optional Information

Notes
32 refs.