Published September 1977 | Version v1
Journal article

Model of secondary electron yields from atomic and polyatomic ion impacts on copper and tungsten surfaces based upon stopping-power calculations

  • 1. Chemistry Department, Brookhaven National Laboratory, Upton, New York 11973

Description

The calculation of the velocity dependence and magnitude of the kinetic secondary electron yield for atomic and polyatomic ions, denoted by gamma-bar/sub a/ and gamma-bar/sub m/, respectively, is modeled on stopping-power equations and compared to experimental results from the dynode materials copper and tungsten. From the experimental data, the relationship gamma-bar/sub m/=Σgamma-bar/sub a/ is verified, which is necessary to the model calculation of gamma-bar/sub m/. The fundamental assumption of this model is that gamma-bar/sub a/ is proportional (even at low ion velocities) to the electronic stopping power (dE/dx)/sub e/ of that projectile in the target. Example calculations are performed for the velocity dependence of gamma-bar/sub a/ for hydrogen, carbon, and fluorine striking copper, and from these results the predicted gamma-bar/sub m/ curves for polyatomic ions are in close agreement with experiment. Analogous calculations for a tungsten surface are outlined and the final results are compared with experiment. The utility of the model is shown by illustrating that the measurement of gamma-bar can provide, not only a relative measurement of (dE/dx)/sub e/ for different ion atomic numbers on the same target, but can also provide a means of determining the nuclear stopping power (dE/dx)/sub n/ at low ion velocities where range measurements are difficult to perform. Values of (dE/dx)/sub n/ derived from measurements for fluorine and carbon striking copper are the same as values predicted by Lindhard and Scharff; for a tungsten target the experimental (dE/dx)/sub n/ values are a factor of 2 larger than theoretical. The relationship of the stopping power values derived from gamma-bar measurements with this model are compared to the values derived from ion range measurements

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Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
48
Journal Issue
9
Series
J. Appl. Phys.
Journal Page Range
3928-3936
ISSN
0021-8979

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