Published August 1, 2014 | Version v1
Journal article

Biomaterial imaging with MeV-energy heavy ion beams

  • 1. CREST, Japan Science and Technology Agency (JST), Chiyoda, Tokyo 102-0075 (Japan)
  • 2. Department of Nuclear Engineering, Kyoto Univ., Uji, Kyoto 611-0011 (Japan)
  • 3. Department of Electronic Science and Engineering, Kyoto Univ., Nishikyo, Kyoto 615-8510 (Japan)
  • 4. Laboratory of Cell Biology and Life Science, Graduate School of Human and Environmental Studies, Kyoto Univ., Sakyo, Kyoto 606-8501 (Japan)
  • 5. Quantum Science and Engineering Center, Kyoto Univ., Uji, Kyoto 611-0011 (Japan)

Description

The spatial distribution of several chemical compounds in biological tissues and cells can be obtained with mass spectrometry imaging (MSI). In conventional secondary ion mass spectrometry (SIMS) with keV-energy ion beams, elastic collisions occur between projectiles and atoms of constituent molecules. The collisions produce fragments, making the acquisition of molecular information difficult. In contrast, ion beams with MeV-energy excite near-surface electrons and enhance the ionization of high-mass molecules; hence, SIMS spectra of fragment-suppressed ionized molecules can be obtained with MeV-SIMS. To compare between MeV and conventional SIMS, we used the two methods based on MeV and Bi3-keV ions, respectively, to obtain molecular images of rat cerebellum. Conventional SIMS images of m/z 184 were clearly observed, but with the Bi3 ion, the distribution of the molecule with m/z 772.5 could be observed with much difficulty. This effect was attributed to the low secondary ion yields and we could not get many signal counts with keV-energy beam. On the other hand, intact molecular ion distributions of lipids were clearly observed with MeV-SIMS, although the mass of all lipid molecules was higher than 500 Da. The peaks of intact molecular ions in MeV-SIMS spectra allowed us to assign the mass. The high secondary ion sensitivity with MeV-energy heavy ions is very useful in biomaterial analysis

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2014.02.088

Additional details

Identifiers

DOI
10.1016/j.nimb.2014.02.088;
PII
S0168-583X(14)00345-0;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
332
Journal Page Range
p. 326-329
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
21. international conference on ion beam analysis
Dates
23-28 Jun 2013
Place
Seattle, WA (United States)

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.