Published April 3, 2009 | Version v1
Journal article

Interrelationship between structural, optical, electronic and elastic properties of materials

  • 1. Department of Physics, Sri Krishnadevaraya University, Anantapur 515 055, A.P. (India)
  • 2. Department of Physics, Government Degree College for Men, Anantapur 515 001, A.P. (India)

Description

Correlations between energy gap, optical electronegativity and electronic polarizability are given for different materials. The calculated electronic polarizabilities are in fair agreement with the values obtained from Clausius-Mossotti relations. This work highlights the significance of the interrelation between refractive index and optical electronegativity. Linear relationships between the elastic constant, crystallographic ratio, radius ratio and lattice energy for II-VI and III-V semiconductors are presented. The observation is explained on the basis of electronegativity and the compactness of crystal packing in the material. The calculated values of elastic constant and lattice energy from the above equations have been compared with the values reported by different workers. The estimated values are in good agreement with the values reported in the literature

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jallcom.2008.06.037

Additional details

Identifiers

DOI
10.1016/j.jallcom.2008.06.037;
PII
S0925-8388(08)00996-1;

Publishing Information

Journal Title
Journal of Alloys and Compounds
Journal Volume
473
Journal Issue
1-2
Journal Page Range
p. 28-35
ISSN
0925-8388
CODEN
JALCEU

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40053011
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CRYSTALLOGRAPHY; CRYSTALS; ELASTICITY; ELECTRONEGATIVITY; ENERGY GAP; POLARIZABILITY; REFRACTIVE INDEX; SEMICONDUCTOR MATERIALS
Descriptors DEC
ELECTRICAL PROPERTIES; MATERIALS; MECHANICAL PROPERTIES; OPTICAL PROPERTIES; PHYSICAL PROPERTIES

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.